Date: March 24, 2016 | 14:00
Title: Probing active/functional sites in perovskites and 2D materials with advanced electron microscopy techniques.
Speaker: Prof. Vaso Tileli, Institute of Materials, École polytechnique fédérale de Lausanne.
Vaso Tileli is currently an Assistant Professor at EPFL working on the fundamental aspects of nanoscale physicochemical phenomena in functional materials revealed by in situ electron microscopy techniques. She received her PhD in 2009 from the College of Nanoscale Science and Engineering at University at Albany, SUNY NY, while working on electron beam/specimen interactions in electromagnetic fields in the presence of gases. She joined as a Marie Curie Intra-European Fellow the Department of Materials at Imperial College London for the development and application of advanced microscopy techniques for functional oxide materials. More recently she spent time at the Department of Physics and Astronomy at University College London working on electron characterization of hybrid and/or 2D structures.
Abstract:
Functional materials are highly sensitive to boundary/surface/interface conditions, which are expected to dominate the overall response when sizes are reduced to the nanoscale. Thus, the request for local measurement techniques to identify their properties is very demanding considering their wide range of applications including high frequency electronics, memory devices, catalysis, and energy harvesting, to name a few. In this presentation, I will discuss several cases where application of advanced transmission electron microscopy has provided insight on fundamental issues associated with 2 dimensional structures (graphene and non carbonaceous) and oxide-based materials. Examples of state-of-the-art aberration corrected transmission electron microscopy (TEM) techniques, which consist of atomic resolution (negative spherical aberration) imaging for defect/oxygen vacancy detection, electron energy loss spectroscopy (EELS) for chemical probing, and off-axis electron holography for electric field mapping as applied to electronic and polar materials will be demonstrated.
Admission is free. No registration required.
Location:
Auditorium, TUM Institute for Advanced Study, Lichtenbergstrasse 2 a, 85748 Garching
Tel +49.89.289.10550
Anfahrt:
U6 Garching Forschungszentrum | Bus 230 (aus Ismaning) / 690 (aus Neufahrn) | A9 Ausfahrt „Garching Nord"